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Cited 22 time in webofscience Cited 44 time in scopus
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High‐performance vacuum‐processed metal oxide thin‐film transistors: A review of recent developments

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dc.contributor.authorHEEJUN KIM-
dc.contributor.author박경호-
dc.contributor.authorHYUN JAE KIM-
dc.date.accessioned2023-04-10T01:40:15Z-
dc.date.available2023-04-10T01:40:15Z-
dc.date.issued2020-07-
dc.identifier.issn1071-0922-
dc.identifier.urihttps://yscholarhub.yonsei.ac.kr/handle/2021.sw.yonsei/6369-
dc.format.extent32-
dc.language영어-
dc.language.isoENG-
dc.publisherWILEY-BLACKWELL-
dc.titleHigh‐performance vacuum‐processed metal oxide thin‐film transistors: A review of recent developments-
dc.typeArticle-
dc.publisher.location미국-
dc.identifier.doi10.1002/jsid.886-
dc.identifier.scopusid2-s2.0-85084225010-
dc.identifier.wosid000528763600001-
dc.identifier.bibliographicCitationJOURNAL OF THE SOCIETY FOR INFORMATION DISPLAY, v.28, no.7, pp 591 - 622-
dc.citation.titleJOURNAL OF THE SOCIETY FOR INFORMATION DISPLAY-
dc.citation.volume28-
dc.citation.number7-
dc.citation.startPage591-
dc.citation.endPage622-
dc.description.isOpenAccessN-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaEngineering-
dc.relation.journalResearchAreaMaterials Science-
dc.relation.journalResearchAreaOptics-
dc.relation.journalResearchAreaPhysics-
dc.relation.journalWebOfScienceCategoryEngineering, Electrical & Electronic-
dc.relation.journalWebOfScienceCategoryMaterials Science, Multidisciplinary-
dc.relation.journalWebOfScienceCategoryOptics-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.subject.keywordPlusA-IGZO TFT-
dc.subject.keywordPlusATOMIC LAYER DEPOSITION-
dc.subject.keywordPlusOXYGEN PARTIAL-PRESSURE-
dc.subject.keywordPlusLOW-FREQUENCY NOISE-
dc.subject.keywordPlusP-TYPE SNO-
dc.subject.keywordPlusSEMICONDUCTOR-BASED CIRCUITS-
dc.subject.keywordPlusBIAS STRESS STABILITY-
dc.subject.keywordPlusN-CHANNEL ZNO-
dc.subject.keywordPlusELECTRICAL-PROPERTIES-
dc.subject.keywordPlusGATE-BIAS-
dc.subject.keywordAuthoroxide thin-film transistors-
dc.subject.keywordAuthorVacuum process-
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