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UV Completion with Self-referenced Discrimination

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dc.contributor.author이성민-
dc.contributor.authorKang, Jiwoo-
dc.contributor.authorLee, Sanghoon-
dc.date.accessioned2023-10-17T02:40:09Z-
dc.date.available2023-10-17T02:40:09Z-
dc.date.issued2020-05-27-
dc.identifier.urihttps://yscholarhub.yonsei.ac.kr/handle/2021.sw.yonsei/6739-
dc.description.abstractA facial UV map is used in many applications such as facial reconstruction, synthesis, recognition, and editing. However, it is difficult to collect a number of the UVs needed for accuracy using 3D scan device, or a multi-view capturing system should be required to construct the UV. An occluded facial UV with holes could be obtained by sampling an image after fitting a 3D facial model by recent alignment methods. In this paper, we introduce a facial UV completion framework to train the deep neural network with a set of incomplete UV textures. By using the fact that the facial texture distributions of the left and right half-sides are almost equal, we devise an adversarial network to model the complete UV distribution of the facial texture. Also, we propose the self-referenced discrimination scheme that uses the facial UV completed from the generator for training real distribution. It is demonstrated that the network can be trained to complete the facial texture with incomplete UVs comparably to when utilizing the ground-truth UVs.-
dc.titleUV Completion with Self-referenced Discrimination-
dc.typeConference-
dc.identifier.doi10.2312/egs.20201018-
dc.citation.conferenceNameEurographics 2020-
dc.citation.conferencePlace스웨덴-
dc.citation.conferenceDate2020-05-25 ~ 2020-05-29-
dc.identifier.urlhttps://diglib.eg.org/handle/10.2312/egs20201018-
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