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초록

In this Letter, a high-pressure annealing (HPA) process is proposed as a way to reduce the thermal budget of Hf0.5Zr0.5O2 (HZO) thin films with ferroelectric behaviors. The low-thermal-budget process is essential for integrating ferroelectric devices in the back-end-of-line to provide more functionalities and effective memory area. For the HZO film annealed at 300?°C using the HPA process, an orthorhombic phase responsible for ferroelectric behavior was formed with a decrease in film thickness, resulting in a remanent polarization (Pr) of ∼13?μC/cm2 (i.e., 2Pr of ∼26?μC/cm2). Meanwhile, when only the annealing time was increased at 300?°C without applying pressure, the HZO film did not crystallize and exhibited linear dielectric properties. Consequently, the HZO films (<10?nm) can be crystallized by applying pressure (15?atm) even at low temperatures of 300?°C, thereby obtaining ferroelectric properties.

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