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A Static Contention-Free Dual-Edge-Triggered Flip-Flop with Redundant Internal Node Transition Elimination for Ultra-Low-Power Applications

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dc.contributor.author김세건-
dc.contributor.authorCho, Keonhee-
dc.contributor.authorBaek, Kyeongrim-
dc.contributor.authorKim, Hyunjun-
dc.contributor.authorBae, Younmee-
dc.contributor.authorKim, Mijung-
dc.contributor.authorSeo, Dongwook-
dc.contributor.authorBaeck, Sangyeop-
dc.contributor.authorLee, Sungjae-
dc.contributor.authorJung, Seong-Ook-
dc.date.accessioned2024-03-20T23:30:13Z-
dc.date.available2024-03-20T23:30:13Z-
dc.date.issued2023-06-11-
dc.identifier.urihttps://yscholarhub.yonsei.ac.kr/handle/2021.sw.yonsei/22909-
dc.titleA Static Contention-Free Dual-Edge-Triggered Flip-Flop with Redundant Internal Node Transition Elimination for Ultra-Low-Power Applications-
dc.typeConference-
dc.identifier.doi10.23919/vlsitechnologyandcir57934.2023.10185239-
dc.citation.title2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)-
dc.citation.conferenceName2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)-
dc.citation.conferencePlace일본-
dc.citation.conferencePlaceKyoto, Japan-
dc.citation.conferenceDate2023-06-11 ~ 2023-06-16-
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