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A Static Contention-Free Dual-Edge-Triggered Flip-Flop with Redundant Internal Node Transition Elimination for Ultra-Low-Power Applications
- Authors
- 김세건; Cho, Keonhee; Baek, Kyeongrim; Kim, Hyunjun; Bae, Younmee; Kim, Mijung; Seo, Dongwook; Baeck, Sangyeop; Lee, Sungjae; Jung, Seong-Ook
- Issue Date
- 11-Jun-2023
- Conference Name
- 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)
- Place
- 일본
Kyoto, Japan
- Conference Date
- 2023-06-11 ~ 2023-06-16
- metadata.conference.dc.citation.conferenceName
- 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)
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Collections - College of Engineering > 공과대학 전기전자공학부 > 공과대학 전기전자공학과 > 3. Conference Papers
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