Differential Read/Write 7T SRAM With Bit-Interleaved Structure for Near-Threshold Operation
- Authors
- Jisang Oh; JUHYUN PARK; KEONHEE CHO; TAE WOO OH; SEONGOOK JUNG
- Issue Date
- Apr-2021
- Publisher
- Institute of Electrical and Electronics Engineers
- Keywords
- 7T bitcell; half-select issue ,; low energy consumption ,; near-threshold voltage ,; static random access memory (SRAM)
- Citation
- IEEE Access, v.9, pp 64,105 - 64,115
- Journal Title
- IEEE Access
- Volume
- 9
- Start Page
- 64,105
- End Page
- 64,115
- URI
- https://yscholarhub.yonsei.ac.kr/handle/2021.sw.yonsei/6351
- DOI
- 10.1109/ACCESS.2021.3075460
- ISSN
- 2169-3536
- Abstract
- Near-threshold voltage (V-th) operation is an effective method for lowering energy consumption. However, it increases the impact of V-th variation significantly, which makes it difficult for previously proposed static random access memory (SRAM) bitcells to achieve high read stability and write ability yields. To achieve these in the near-V-th region, a differential 7T SRAM bitcell is proposed in which an additional row-based control signal and an nMOS transistor between the pull-up and pull-down transistors is adopted on one side of the cross-coupled inverter. In addition, the proposed SRAM bitcell can use a bit-interleaved structure without the half-select issue. Compared to differential 10T and 12T SRAM, the proposed differential 7T SRAM achieves 5% and 6% higher SRAM operating frequency and 70% and 23% lower operation energy consumption with a 33% and 49% smaller bitcell area, respectively.
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Collections - College of Engineering > Electrical and Electronic Engineering > 1. Journal Articles
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