Detailed Information

Cited 0 time in webofscience Cited 0 time in scopus
Metadata Downloads

SRAM Write-and Performance-Assist Cells for Reducing Interconnect Resistance Effects Increased with Technology Scaling

Full metadata record
DC Field Value Language
dc.contributor.authorCho, Keonhee-
dc.contributor.authorCho, Keonhee-
dc.date.accessioned2023-04-19T08:40:08Z-
dc.date.available2023-04-19T08:40:08Z-
dc.date.issued2021-06-16-
dc.identifier.urihttps://yscholarhub.yonsei.ac.kr/handle/2021.sw.yonsei/6538-
dc.titleSRAM Write-and Performance-Assist Cells for Reducing Interconnect Resistance Effects Increased with Technology Scaling-
dc.typeConference-
dc.identifier.doi10.23919/VLSICircuits52068.2021.9492505-
dc.citation.titleIEEE Symposium on VLSI Circuits, Digest of Technical Papers-
dc.citation.conferenceNameSymposium on VLSI Technology and Circuits-
dc.citation.conferencePlace일본-
dc.citation.conferenceDate2021-06-13 ~ 2021-06-19-
Files in This Item
There are no files associated with this item.
Appears in
Collections
College of Engineering > 공과대학 전기전자공학부 > 공과대학 전기전자공학과 > 3. Conference Papers

qrcode

Items in Scholar Hub are protected by copyright, with all rights reserved, unless otherwise indicated.

Related Researcher

Researcher Cho, Keonhee photo

Cho, Keonhee
공과대학 전기전자공학과
Read more

Altmetrics

Total Views & Downloads

BROWSE