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SRAM Write-and Performance-Assist Cells for Reducing Interconnect Resistance Effects Increased with Technology Scaling
- Authors
- Cho, Keonhee; Cho, Keonhee
- Issue Date
- 16-Jun-2021
- Conference Name
- IEEE Symposium on VLSI Circuits, Digest of Technical Papers
- Place
- 일본
- Conference Date
- 2021-06-13 ~ 2021-06-19
- metadata.conference.dc.citation.conferenceName
- Symposium on VLSI Technology and Circuits
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Collections - College of Engineering > 공과대학 전기전자공학부 > 공과대학 전기전자공학과 > 3. Conference Papers
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