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우수-기수 모드 해석을 통한 표면 실장 소자의 기생 성분 계산 방법 Go to Link

ArticleIssue Date2023Citation한국전자파학회 논문지, v.34, no.1, pp 57 - 60Publisher한국전자파학회

Yonsei University 50 Yonsei-ro Seodaemun-gu, Seoul, 03722, Republic of Korea1599-1885

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